Current Event

April 2010 - July 2010
"Manufacturability, Test, and Diagnostics for Microelectronics"
Lecture series at the University of Bremen, Germany (http://www.uni-bremen.de)

Past Events

April 2009 - July 2009
"Manufacturability, Test, and Diagnostics for Microelectronics"
Lecture series at the University of Bremen, Germany (http://www.uni-bremen.de)

April 2008 - July 2008
"Manufacturability, Test, and Diagnostics for Microelectronics"
Lecture series at the University of Bremen, Germany (http://www.uni-bremen.de)

April 2007 - July 2007
"Automatische Test- und Diagnoseverfahren für Mikroelektronik"
Lecture series at the University of Bremen, Germany (http://www.uni-bremen.de)

06/14/2007
"Inspektor Test jagt Defekte"
University of Hannover, Germany

10/23/2006
"DFT for TAP-Based Debug" (for Intellitech, Corp.)
Santa Clara, CA

10/06/2006
"Delay Test with Integrated Timing Analysis"
Stanford University, Palo ALto, CA

08/18/2006
"Defect/Design Learning from Electrical Test"
Unersity of Stuttgart, Germany

06/22/2006
"Defects, Whose Fault Are They?"
University of Bremen, Germany